• 14 - 17 October 2019
  • Rochester Riverside Convention Center | Rochester, New York, United States
  • See us in Rochester New York, at the INTEROPTICS Booth 416
  • Many features
    (in a low cost system!)

    • Easy to use, 4 inch aperture downward looking, rigid platform
    • High throughput, vibration isolation table not required
    • High resolution, low distortion 1x and 4x optical zoom
    • Low coherence, no spurious backside fringes
    • High reliability LED light source at 633nm
    • Turn-key system with integrated staging
    • Sub-nanometer precision

    Stop using laser Fizeau interferometers for flat work!

    Add capacity for flat testing with lower cost OptoFlat.
    Free up other laser interferometers for spherical work.

    Measure flatness

    Of thin glass without backside fringes

    Measure wavefront

    With optional reflection flat fixture

    Measure process fingerprint

    High-pass filtered maps show polishing marks

    OptoFlat, designed for production quality control and incoming quality assurance of polished plano optical components is a low cost, high performance flatness interferometer. Quickly and efficiently measure surface flatness of mirrors, coated and uncoated, beamsplitters, windows, prisms, thin glass wafers and glass hard drive substrates in a small footprint, rigid platform that does not need a vibration isolation table in typical lab and production enviroments. Measure the flatness of precision polished metal and ceramic components as well.

    OptoFlat

    See the many interferometer features

    OptoFlat technology

    See what makes OptoFlat unique

    Recent News

    October 16, 2019 Wednesday

    Paper Presentation

    Dr Chris L. Koliopoulos will be presenting on Wednesday, a paper titled "Advantages of a low coherence interferometer for optical testing", during Session 9: Advances in Freeform and Novel Metrology Techniques, SPIE OPTIFAB Conference in Rochester, New York U.S.A. InterOptics is a SPIE Corporate Member.

    June 24, 2019 Monday

    Paper Presentation - Optical Measurement Systems for Industrial Inspection XI

    Dr Klaus Freischlad will be presenting a paper titled "Topography measurement of glass disk substrates with subnanometer resolution", during Session 3 Interferometry II, SPIE Optical Metrology Conference in Munich Germany. InterOptics is a SPIE Corporate Member.

    February 5-7, 2019

    See us at Photonics West, Moscone Center South, Booth #128

    Come and see us at SPIE Photonics West! We will be displaying OptoFlat, the low coherence flatness interferometer, a Prism Award Finalist, at Booth #128 as part of the Arizona Optics Valley pavilion. InterOptics is a SPIE Corporate Member and a member of the Arizona Technology Council Optics Valley.

    Bring samples to measure!

    November 30, 2018

    OptoFlat is a 2019 Prism Award Finalist

    SPIE and Photonics Media Prism Award program recognizes outstanding examples of the imaginative range and innovation reach of photonics R&D. "The Prism Awards give well-deserved recognition to technical teams in the industry who have climbed over one of the most challenging walls, bringing a leading-edge product from an R&D lab to the market." -Laura A. Smoliar, Managing Director at Berkeley Catalyst Fund, and 2018 Prism Award judge.

    August 20, 2018

    SPIE Optics + Photonics, San Diego

    InterOptics exhibits at the SPIE Optics + Photonics Conference.

    August 20, 2018

    Presenting OptoFlat

    InterOptics introduces OptoFlat, flatness interferometer incorporating engineered coherence for high precision and capability to measure plane parallel optical components without spurious interference from the backside.

    Spotlight

    InterOptics Building

    InterOptics operates from the Shamrock Optics Center, an 18,000 square foot facility with temperature controlled metrology rooms supporting optical fabrication and precision CNC machining. Assembly areas include HEPA clean airflow benches.

    We are growing, looking for more people to join us in creating new precision optical metrology systems.